Conference

A Dual-Path Gated Attention Transformer Framework for Smart Meter Measurement Error Prediction under Complex Environmental Stresses

Bibliographic Details
Title: A Dual-Path Gated Attention Transformer Framework for Smart Meter Measurement Error Prediction under Complex Environmental Stresses
Authors: Wang, Wenjing, Cao, Shu, Huang, Tianfu, Hu, Xiaoxu, Zheng, Shunyuan, Gao, Wei
Source: 2026 IEEE 3rd International Conference on Electrical Power Systems and Intelligent Control (EPSIC) Electrical Power Systems and Intelligent Control (EPSIC), 2026 IEEE 3rd International Conference on. :1-11 May, 2026
Relation: 2026 IEEE 3rd International Conference on Electrical Power Systems and Intelligent Control (EPSIC)
Database: IEEE Xplore Digital Library
Description
ISBN:9798331552534
9798331552541
DOI:10.1109/EPSIC70071.2026.11590067