AI Head-Node Socket Interconnect Yield, Warpage, and Functionality

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: AI Head-Node Socket Interconnect Yield, Warpage, and Functionality
Συγγραφείς: Klein, Steven, Abraham, Amit, Huettis, Alexander, Rawlings, Taylor, Erike, Eric, Schichtel, Jacob, Bakare, Sugadh, Aravamudhan, Srinivasa, Ooi, Renn Chan, Raghavan, Prasanna
Πηγή: 2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1661-1665 May, 2026
Relation: 2026 IEEE 76th Electronic Components and Technology Conference (ECTC)
Βάση Δεδομένων: IEEE Xplore Digital Library
Περιγραφή
ISBN:9798331564179
9798331564186
ISSN:23775726
05695503
DOI:10.1109/ECTC51846.2026.00272