Conference
Trace-Element Effects in SAC Alloys: Mitigating HIP Defects in 5G/Automotive SoC SMT Assemblies
| Τίτλος: | Trace-Element Effects in SAC Alloys: Mitigating HIP Defects in 5G/Automotive SoC SMT Assemblies |
|---|---|
| Συγγραφείς: | Lin, Tai-Yin, Chen, Fa-Chuan, Chu, Che-Kuan, Lin, Chien-Min, Xu, Zhe-Cheng, Yeh, Bo-Kuan, Chen, Hsin-Long |
| Πηγή: | 2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1964-1969 May, 2026 |
| Relation: | 2026 IEEE 76th Electronic Components and Technology Conference (ECTC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331564179 9798331564186 |
|---|---|
| ISSN: | 23775726 05695503 |
| DOI: | 10.1109/ECTC51846.2026.00322 |