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A Survey of Functional Testing and Validation of Quantum Circuits

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Τίτλος: A Survey of Functional Testing and Validation of Quantum Circuits
Συγγραφείς: Andrews, E., Jayasena, A., Mishra, P.
Πηγή: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 43(5):5-19 Oct, 2026
Βάση Δεδομένων: IEEE Xplore Digital Library
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        Value: 10.1109/MDAT.2026.3698368
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