Academic Journal
A Survey of Functional Testing and Validation of Quantum Circuits
| Τίτλος: | A Survey of Functional Testing and Validation of Quantum Circuits |
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| Συγγραφείς: | Andrews, E., Jayasena, A., Mishra, P. |
| Πηγή: | IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 43(5):5-19 Oct, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 21682356 21682364 |
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| DOI: | 10.1109/MDAT.2026.3698368 |