Παραπομπή σε μορφή APA (7η εκδ.)

Andrews, E., Jayasena, A., & Mishra, P. (2026). A Survey of Functional Testing and Validation of Quantum Circuits. IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, 43(5), 5-19. https://doi.org/10.1109/MDAT.2026.3698368

Παραπομπή σε μορφή Chicago (17η εκδ.)

Andrews, E., A. Jayasena, και P. Mishra. "A Survey of Functional Testing and Validation of Quantum Circuits." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test 43, no. 5 (2026): 5-19. https://doi.org/10.1109/MDAT.2026.3698368.

Παραπομπή σε μορφή MLA (9th εκδ.)

Andrews, E., et al. "A Survey of Functional Testing and Validation of Quantum Circuits." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, vol. 43, no. 5, 2026, pp. 5-19, https://doi.org/10.1109/MDAT.2026.3698368.