Ma, Y., Liang, S., He, T., Wen, J., Li, A., Ma, H., . . . Zhang, Y. (2026). Mitigating Topographic Effects in Optical Remote Sensing: From surface reflectance to high-level products. IEEE Geoscience and Remote Sensing Magazine, Geoscience and Remote Sensing Magazine, IEEE, IEEE Geosci. Remote Sens. Mag., 14(5), 117-159. https://doi.org/10.1109/MGRS.2026.3690171
Παραπομπή σε μορφή Chicago (17η εκδ.)Ma, Y., et al. "Mitigating Topographic Effects in Optical Remote Sensing: From Surface Reflectance to High-level Products." IEEE Geoscience and Remote Sensing Magazine, Geoscience and Remote Sensing Magazine, IEEE, IEEE Geosci. Remote Sens. Mag. 14, no. 5 (2026): 117-159. https://doi.org/10.1109/MGRS.2026.3690171.
Παραπομπή σε μορφή MLA (9th εκδ.)Ma, Y., et al. "Mitigating Topographic Effects in Optical Remote Sensing: From Surface Reflectance to High-level Products." IEEE Geoscience and Remote Sensing Magazine, Geoscience and Remote Sensing Magazine, IEEE, IEEE Geosci. Remote Sens. Mag., vol. 14, no. 5, 2026, pp. 117-159, https://doi.org/10.1109/MGRS.2026.3690171.