Conference

Material Property Prediction of Bi-doped SnAgCu Solders under High Strain Rates of Mechanical Shock and Vibration

Bibliographic Details
Title: Material Property Prediction of Bi-doped SnAgCu Solders under High Strain Rates of Mechanical Shock and Vibration
Authors: Lall, Pradeep, Mehta, Vishal, Suhling, Jeff, Locker, David
Source: 2026 27th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2026 27th International Conference on. :1-8 Apr, 2026
Relation: 2026 27th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Database: IEEE Xplore Digital Library
Description
ISBN:9798331562496
9798331562502
ISSN:28338596
28338553
DOI:10.1109/EuroSimE69483.2026.11511964