Li, Y., Guo, Y., Gu, T., & Ge, C. (2026). On Exploiting Single-Trace Side-Channel Leakage of SEAL-Embedded Library. IEEE Transactions on Information Forensics and Security, Information Forensics and Security, IEEE Transactions on, IEEE Trans.Inform.Forensic Secur., 21, 5388. https://doi.org/10.1109/TIFS.2026.3688912
Παραπομπή σε μορφή Chicago (17η εκδ.)Li, Y., Y. Guo, T. Gu, και C. Ge. "On Exploiting Single-Trace Side-Channel Leakage of SEAL-Embedded Library." IEEE Transactions on Information Forensics and Security, Information Forensics and Security, IEEE Transactions on, IEEE Trans.Inform.Forensic Secur. 21 (2026): 5388. https://doi.org/10.1109/TIFS.2026.3688912.
Παραπομπή σε μορφή MLA (9th εκδ.)Li, Y., et al. "On Exploiting Single-Trace Side-Channel Leakage of SEAL-Embedded Library." IEEE Transactions on Information Forensics and Security, Information Forensics and Security, IEEE Transactions on, IEEE Trans.Inform.Forensic Secur., vol. 21, 2026, p. 5388, https://doi.org/10.1109/TIFS.2026.3688912.