Conference
Improved Electrical Stress Reliability and Breakdown in MoS2 FETs by Se-Alloying
| Title: | Improved Electrical Stress Reliability and Breakdown in MoS2 FETs by Se-Alloying |
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| Authors: | Dar, Aadil Bashir, Andrabi, S Tehmeena, Yadav, Megha, Shah, Asif A, Rai, Anand K, B M, R Archana, Verma, Rupali, Patbhaje, Utpreksh, Shrivastava, Mayank |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-4 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |
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