Yang, G., Tan, J., Zhu, Q., Liang, L., Bao, L., Wang, Z., & Cai, Y. (2026). Optimizing Niobium-Oxide Film Deposition via Pulsed-DC Sputtering by Dual-Stage Deep Neural Network-Gaussian Process Regression Framework. 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE, 1. https://doi.org/10.1109/EDTM65772.2026.11497950
Παραπομπή σε μορφή Chicago (17η εκδ.)Yang, Gaoqi, Jiajun Tan, Qingyun Zhu, Ling Liang, Lin Bao, Zongwei Wang, και Yimao Cai. "Optimizing Niobium-Oxide Film Deposition via Pulsed-DC Sputtering by Dual-Stage Deep Neural Network-Gaussian Process Regression Framework." 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE 2026: 1. https://doi.org/10.1109/EDTM65772.2026.11497950.
Παραπομπή σε μορφή MLA (9th εκδ.)Yang, Gaoqi, et al. "Optimizing Niobium-Oxide Film Deposition via Pulsed-DC Sputtering by Dual-Stage Deep Neural Network-Gaussian Process Regression Framework." 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE, 2026, p. 1, https://doi.org/10.1109/EDTM65772.2026.11497950.