Academic Journal

Toward Understanding Functional Bugs in EVM-Based Blockchain Systems

Bibliographic Details
Title: Toward Understanding Functional Bugs in EVM-Based Blockchain Systems
Authors: Ye, M., Nan, Y., Su, J., Zhong, Z., Xiao, Y., Zheng, P., Zheng, Z.
Source: IEEE Transactions on Software Engineering IIEEE Trans. Software Eng. Software Engineering, IEEE Transactions on. 52(7):2219-2232 Jul, 2026
Database: IEEE Xplore Digital Library
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