Academic Journal
Toward Understanding Functional Bugs in EVM-Based Blockchain Systems
| Τίτλος: | Toward Understanding Functional Bugs in EVM-Based Blockchain Systems |
|---|---|
| Συγγραφείς: | Ye, M., Nan, Y., Su, J., Zhong, Z., Xiao, Y., Zheng, P., Zheng, Z. |
| Πηγή: | IEEE Transactions on Software Engineering IIEEE Trans. Software Eng. Software Engineering, IEEE Transactions on. 52(7):2219-2232 Jul, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00985589 19393520 23263881 |
|---|---|
| DOI: | 10.1109/TSE.2026.3685454 |