Ye, M., Nan, Y., Su, J., Zhong, Z., Xiao, Y., Zheng, P., & Zheng, Z. (2026). Toward Understanding Functional Bugs in EVM-Based Blockchain Systems. IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng., 52(7), 2219-2232. https://doi.org/10.1109/TSE.2026.3685454
Παραπομπή σε μορφή Chicago (17η εκδ.)Ye, M., Y. Nan, J. Su, Z. Zhong, Y. Xiao, P. Zheng, και Z. Zheng. "Toward Understanding Functional Bugs in EVM-Based Blockchain Systems." IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng. 52, no. 7 (2026): 2219-2232. https://doi.org/10.1109/TSE.2026.3685454.
Παραπομπή σε μορφή MLA (9th εκδ.)Ye, M., et al. "Toward Understanding Functional Bugs in EVM-Based Blockchain Systems." IEEE Transactions on Software Engineering, Software Engineering, IEEE Transactions on, IIEEE Trans. Software Eng., vol. 52, no. 7, 2026, pp. 2219-2232, https://doi.org/10.1109/TSE.2026.3685454.