Academic Journal
Total-Ionizing-Dose Effects and Low-Frequency Noise in 90 nm, 3.3 V Input/Output CMOS Devices
| Τίτλος: | Total-Ionizing-Dose Effects and Low-Frequency Noise in 90 nm, 3.3 V Input/Output CMOS Devices |
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| Συγγραφείς: | Neuendank, J., Kirby, T., Barnaby, H.J., Fleetwood, D.M., Bonaldo, S., Loveless, T.D., Westfall, S., Muscat, P., Nour, M., Chambers, M. |
| Πηγή: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 73(5):2013-2021 May, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2026.3684446 |