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Dual EMAT–MIEC Testing Method for High-Speed Surface and Backside Defect Inspection

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Τίτλος: Dual EMAT–MIEC Testing Method for High-Speed Surface and Backside Defect Inspection
Συγγραφείς: Xiao, Y., Feng, B., Guo, Y., Wang, K., Song, Y., Wang, Z., Kang, Y.
Πηγή: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 75:1-9 2026
Βάση Δεδομένων: IEEE Xplore Digital Library
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