Academic Journal
Dual EMAT–MIEC Testing Method for High-Speed Surface and Backside Defect Inspection
| Τίτλος: | Dual EMAT–MIEC Testing Method for High-Speed Surface and Backside Defect Inspection |
|---|---|
| Συγγραφείς: | Xiao, Y., Feng, B., Guo, Y., Wang, K., Song, Y., Wang, Z., Kang, Y. |
| Πηγή: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 75:1-9 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00189456 15579662 |
|---|---|
| DOI: | 10.1109/TIM.2026.3674241 |