Maranon, E., Benevenuti, F., Medina, N., Added, N., Aguiar, V., Alberton, S., . . . Kastensmidt, F. (2026). Reliable AI Accelerator Design Using Multiple Fault-Tolerance Techniques on SRAM-Based APSoCs. IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., 73(8), 2915-2924. https://doi.org/10.1109/TNS.2026.3671122
Παραπομπή σε μορφή Chicago (17η εκδ.)Maranon, E., F. Benevenuti, N.H Medina, N. Added, V.A.P Aguiar, S.G.P.N Alberton, J.V Schervenin, M.S Pereira, και F.L Kastensmidt. "Reliable AI Accelerator Design Using Multiple Fault-Tolerance Techniques on SRAM-Based APSoCs." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. 73, no. 8 (2026): 2915-2924. https://doi.org/10.1109/TNS.2026.3671122.
Παραπομπή σε μορφή MLA (9th εκδ.)Maranon, E., et al. "Reliable AI Accelerator Design Using Multiple Fault-Tolerance Techniques on SRAM-Based APSoCs." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., vol. 73, no. 8, 2026, pp. 2915-2924, https://doi.org/10.1109/TNS.2026.3671122.