Academic Journal
Reliable AI Accelerator Design Using Multiple Fault-Tolerance Techniques on SRAM-Based APSoCs
| Τίτλος: | Reliable AI Accelerator Design Using Multiple Fault-Tolerance Techniques on SRAM-Based APSoCs |
|---|---|
| Συγγραφείς: | Maranon, E., Benevenuti, F., Medina, N.H., Added, N., Aguiar, V.A.P., Alberton, S.G.P.N., Schervenin, J.V., Pereira, M.S., Kastensmidt, F.L. |
| Πηγή: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 73(8):2915-2924 Aug, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
|---|---|
| DOI: | 10.1109/TNS.2026.3671122 |