Shen, Y., Chen, J., Yu, K., Ma, S., & Qi, L. (2025). A Path Depth Optimization Based Method for Concurrent Temporal Test Case Generation. 2025 7th International Academic Exchange Conference on Science and Technology Innovation (IAECST), Science and Technology Innovation (IAECST), 2025 7th International Academic Exchange Conference on, 17. https://doi.org/10.1109/IAECST68792.2025.11415127
Παραπομπή σε μορφή Chicago (17η εκδ.)Shen, Yafeng, Jian Chen, Ke Yu, Siyou Ma, και Lianzhi Qi. "A Path Depth Optimization Based Method for Concurrent Temporal Test Case Generation." 2025 7th International Academic Exchange Conference on Science and Technology Innovation (IAECST), Science and Technology Innovation (IAECST), 2025 7th International Academic Exchange Conference on 2025: 17. https://doi.org/10.1109/IAECST68792.2025.11415127.
Παραπομπή σε μορφή MLA (9th εκδ.)Shen, Yafeng, et al. "A Path Depth Optimization Based Method for Concurrent Temporal Test Case Generation." 2025 7th International Academic Exchange Conference on Science and Technology Innovation (IAECST), Science and Technology Innovation (IAECST), 2025 7th International Academic Exchange Conference on, 2025, p. 17, https://doi.org/10.1109/IAECST68792.2025.11415127.