Conference
A Path Depth Optimization Based Method for Concurrent Temporal Test Case Generation
| Τίτλος: | A Path Depth Optimization Based Method for Concurrent Temporal Test Case Generation |
|---|---|
| Συγγραφείς: | Shen, Yafeng, Chen, Jian, Yu, Ke, Ma, Siyou, Qi, Lianzhi |
| Πηγή: | 2025 7th International Academic Exchange Conference on Science and Technology Innovation (IAECST) Science and Technology Innovation (IAECST), 2025 7th International Academic Exchange Conference on. :17-26 Dec, 2025 |
| Relation: | 2025 7th International Academic Exchange Conference on Science and Technology Innovation (IAECST) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331580247 9798331580230 9798331580254 |
|---|---|
| DOI: | 10.1109/IAECST68792.2025.11415127 |