From Technical Excellence to Practical Adoption: Lessons Learned Building an ML-Enhanced Trace Analysis Tool

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: From Technical Excellence to Practical Adoption: Lessons Learned Building an ML-Enhanced Trace Analysis Tool
Συγγραφείς: Shahedi, Kaveh, Khouzam, Matthew, Li, Heng, Lamothe, Maxime, Khomh, Foutse
Πηγή: 2025 40th IEEE/ACM International Conference on Automated Software Engineering (ASE) ASE Automated Software Engineering (ASE), 2025 40th IEEE/ACM International Conference on. :3462-3474 Nov, 2025
Relation: 2025 40th IEEE/ACM International Conference on Automated Software Engineering (ASE)
Βάση Δεδομένων: IEEE Xplore Digital Library