Conference

From Technical Excellence to Practical Adoption: Lessons Learned Building an ML-Enhanced Trace Analysis Tool

Bibliographic Details
Title: From Technical Excellence to Practical Adoption: Lessons Learned Building an ML-Enhanced Trace Analysis Tool
Authors: Shahedi, Kaveh, Khouzam, Matthew, Li, Heng, Lamothe, Maxime, Khomh, Foutse
Source: 2025 40th IEEE/ACM International Conference on Automated Software Engineering (ASE) ASE Automated Software Engineering (ASE), 2025 40th IEEE/ACM International Conference on. :3462-3474 Nov, 2025
Relation: 2025 40th IEEE/ACM International Conference on Automated Software Engineering (ASE)
Database: IEEE Xplore Digital Library
Description
ISBN:9798350357332
9798350357349
ISSN:26431572
19384300
DOI:10.1109/ASE63991.2025.00286