Conference

Logic for Bus Interconnect Testing

Bibliographic Details
Title: Logic for Bus Interconnect Testing
Authors: Hahanov, Vladimir, Devadze, David, Davitadze, Zaza, Chumachenko, Svetlana, Litvinova, Eugenia, Obrizan, Volodymyr
Source: 2025 IEEE East-West Design & Test Symposium (EWDTS) East-West Design & Test Symposium, 2025 IEEE. :1-5 Dec, 2025
Relation: 2025 IEEE East-West Design & Test Symposium (EWDTS)
Database: IEEE Xplore Digital Library
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  Availability: 0
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DbLabel: IEEE Xplore Digital Library
An: edseee.11303649
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PubType: Conference
PubTypeId: conference
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  Data: <searchLink fieldCode="AR" term="%22Hahanov%2C+Vladimir%22">Hahanov, Vladimir</searchLink><br /><searchLink fieldCode="AR" term="%22Devadze%2C+David%22">Devadze, David</searchLink><br /><searchLink fieldCode="AR" term="%22Davitadze%2C+Zaza%22">Davitadze, Zaza</searchLink><br /><searchLink fieldCode="AR" term="%22Chumachenko%2C+Svetlana%22">Chumachenko, Svetlana</searchLink><br /><searchLink fieldCode="AR" term="%22Litvinova%2C+Eugenia%22">Litvinova, Eugenia</searchLink><br /><searchLink fieldCode="AR" term="%22Obrizan%2C+Volodymyr%22">Obrizan, Volodymyr</searchLink>
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  Data: 2025 IEEE East-West Design & Test Symposium (EWDTS) East-West Design & Test Symposium, 2025 IEEE. :1-5 Dec, 2025
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  Data: 2025 IEEE East-West Design & Test Symposium (EWDTS)
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RecordInfo BibRecord:
  BibEntity:
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      – Type: doi
        Value: 10.1109/EWDTS67441.2025.11303649
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        PageCount: 5
        StartPage: 1
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      – TitleFull: Logic for Bus Interconnect Testing
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      – PersonEntity:
          Name:
            NameFull: Hahanov, Vladimir
      – PersonEntity:
          Name:
            NameFull: Devadze, David
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            NameFull: Davitadze, Zaza
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            NameFull: Chumachenko, Svetlana
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          Name:
            NameFull: Litvinova, Eugenia
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            NameFull: Obrizan, Volodymyr
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          Dates:
            – D: 05
              M: 12
              Type: published
              Y: 2025
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            – TitleFull: 2025 IEEE East-West Design & Test Symposium (EWDTS), East-West Design & Test Symposium, 2025 IEEE
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