Conference

Logic for Bus Interconnect Testing

Bibliographic Details
Title: Logic for Bus Interconnect Testing
Authors: Hahanov, Vladimir, Devadze, David, Davitadze, Zaza, Chumachenko, Svetlana, Litvinova, Eugenia, Obrizan, Volodymyr
Source: 2025 IEEE East-West Design & Test Symposium (EWDTS) East-West Design & Test Symposium, 2025 IEEE. :1-5 Dec, 2025
Relation: 2025 IEEE East-West Design & Test Symposium (EWDTS)
Database: IEEE Xplore Digital Library
Description
ISBN:9798331559182
9798331559199
ISSN:2472761X
2373826X
DOI:10.1109/EWDTS67441.2025.11303649