APA (7th ed.) Citation

Hahanov, V., Devadze, D., Davitadze, Z., Chumachenko, S., Litvinova, E., & Obrizan, V. (2025). Logic for Bus Interconnect Testing. 2025 IEEE East-West Design & Test Symposium (EWDTS), East-West Design & Test Symposium, 2025 IEEE, 1. https://doi.org/10.1109/EWDTS67441.2025.11303649

Chicago Style (17th ed.) Citation

Hahanov, Vladimir, David Devadze, Zaza Davitadze, Svetlana Chumachenko, Eugenia Litvinova, and Volodymyr Obrizan. "Logic for Bus Interconnect Testing." 2025 IEEE East-West Design & Test Symposium (EWDTS), East-West Design & Test Symposium, 2025 IEEE 2025: 1. https://doi.org/10.1109/EWDTS67441.2025.11303649.

MLA (9th ed.) Citation

Hahanov, Vladimir, et al. "Logic for Bus Interconnect Testing." 2025 IEEE East-West Design & Test Symposium (EWDTS), East-West Design & Test Symposium, 2025 IEEE, 2025, p. 1, https://doi.org/10.1109/EWDTS67441.2025.11303649.