Academic Journal
The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities
| Τίτλος: | The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities |
|---|---|
| Συγγραφείς: | Kundu, S., Das, S., Menon, A., Bhattacharya, S., Raha, A., Basu, K. |
| Πηγή: | IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 43(4):8-24 Aug, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://resolver.ebsco.com/c/fiv2js/result?sid=EBSCO:edseee&genre=article&issn=21682356&ISBN=&volume=43&issue=4&date=20260801&spage=8&pages=8-24&title=IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test&atitle=The%20Fault%20in%20Our%20Chips%3A%20A%20Survey%20on%20Edge%20AI%20Accelerator%20Vulnerabilities&aulast=Kundu%2C%20S.&id=DOI:10.1109/MDAT.2025.3637710 Name: Full Text Finder (for New FTF UI) (ns324271) Category: fullText Text: Full Text Finder MouseOverText: Full Text Finder |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/MDAT.2025.3637710 PhysicalDescription: Pagination: PageCount: 17 StartPage: 8 Titles: – TitleFull: The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kundu, S. – PersonEntity: Name: NameFull: Das, S. – PersonEntity: Name: NameFull: Menon, A. – PersonEntity: Name: NameFull: Bhattacharya, S. – PersonEntity: Name: NameFull: Raha, A. – PersonEntity: Name: NameFull: Basu, K. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 08 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 21682356 – Type: issn-print Value: 21682364 – Type: issn-locals Value: edseee.IEEEJournals Numbering: – Type: volume Value: 43 – Type: issue Value: 4 Titles: – TitleFull: IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test Type: main |
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