Academic Journal
The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities
| Τίτλος: | The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities |
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| Συγγραφείς: | Kundu, S., Das, S., Menon, A., Bhattacharya, S., Raha, A., Basu, K. |
| Πηγή: | IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 43(4):8-24 Aug, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 21682356 21682364 |
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| DOI: | 10.1109/MDAT.2025.3637710 |