Kundu, S., Das, S., Menon, A., Bhattacharya, S., Raha, A., & Basu, K. (2026). The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities. IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, 43(4), 8-24. https://doi.org/10.1109/MDAT.2025.3637710
Παραπομπή σε μορφή Chicago (17η εκδ.)Kundu, S., S. Das, A. Menon, S. Bhattacharya, A. Raha, και K. Basu. "The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test 43, no. 4 (2026): 8-24. https://doi.org/10.1109/MDAT.2025.3637710.
Παραπομπή σε μορφή MLA (9th εκδ.)Kundu, S., et al. "The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities." IEEE Design & Test, Design & Test, IEEE, IEEE Des. Test, vol. 43, no. 4, 2026, pp. 8-24, https://doi.org/10.1109/MDAT.2025.3637710.