Academic Journal
Degradation Analysis of InAlN/GaN Transistors Under Simulated Venus Surface Conditions
| Τίτλος: | Degradation Analysis of InAlN/GaN Transistors Under Simulated Venus Surface Conditions |
|---|---|
| Συγγραφείς: | Eisner, S.R., Heussen, Z.N., Cordero, S., Niroula, J., Naphy, J., Isamotu, M.F., Surdi, H., Yuan, M., Xie, Q., Nemanich, R.J., Palacios, T., Rais-Zadeh, M., Hunter, G.W., Senesky, D.G. |
| Πηγή: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(12):6610-6617 Dec, 2025 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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