Academic Journal
The Impact of Large-Amplitude Intermittent Current Pulsing on the Reliability of Die Metal–Dielectric Structures
| Τίτλος: | The Impact of Large-Amplitude Intermittent Current Pulsing on the Reliability of Die Metal–Dielectric Structures |
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| Συγγραφείς: | Lee, C., Vaitheeswaran, P.K., Subbarayan, G., Park, Y., Chung, J., Krishnan, S. |
| Πηγή: | IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manuf. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 16(4):801-814 Apr, 2026 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 21563950 21563985 |
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| DOI: | 10.1109/TCPMT.2025.3630547 |