Mitulescu, C. R., Codreanu, N., Ionescu, C., Svasta, P., Branzei, M., & Enache, B. L. (2025). Measurements at High Temperature for Thermal Resistance of MOSFETs. 2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC), Microelectronics and Packaging Conference & Exhibition (EMPC), 2025 25th European, 1. https://doi.org/10.23919/EMPC63132.2025.11222414
Παραπομπή σε μορφή Chicago (17η εκδ.)Mitulescu, Corina Ruxandra, Norocel Codreanu, Ciprian Ionescu, Paul Svasta, Mihai Branzei, και Bianca Laura Enache. "Measurements at High Temperature for Thermal Resistance of MOSFETs." 2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC), Microelectronics and Packaging Conference & Exhibition (EMPC), 2025 25th European 2025: 1. https://doi.org/10.23919/EMPC63132.2025.11222414.
Παραπομπή σε μορφή MLA (9th εκδ.)Mitulescu, Corina Ruxandra, et al. "Measurements at High Temperature for Thermal Resistance of MOSFETs." 2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC), Microelectronics and Packaging Conference & Exhibition (EMPC), 2025 25th European, 2025, p. 1, https://doi.org/10.23919/EMPC63132.2025.11222414.