Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Measurements at High Temperature for Thermal Resistance of MOSFETs |
| Συγγραφείς: |
Mitulescu, Corina Ruxandra, Codreanu, Norocel, Ionescu, Ciprian, Svasta, Paul, Branzei, Mihai, Enache, Bianca Laura |
| Πηγή: |
2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC) Microelectronics and Packaging Conference & Exhibition (EMPC), 2025 25th European. :1-7 Sep, 2025 |
| Relation: |
2025 25th European Microelectronics and Packaging Conference & Exhibition (EMPC) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |