Conference
Thermal-Resistance-Based Reliability of TIM1 Materials in a Lidded Thermal Test Vehicle Under Active Thermal Load-Cycling
| Τίτλος: | Thermal-Resistance-Based Reliability of TIM1 Materials in a Lidded Thermal Test Vehicle Under Active Thermal Load-Cycling |
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| Συγγραφείς: | Sternberg, Maik, May, Daniel, Wargulski, Dan R., Pareek, Kaushal Arun, Wunderle, Bernhard, Ras, Mohamad Abo |
| Πηγή: | 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025 |
| Relation: | 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.11216935 RelevancyScore: 1117 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 1116.81677246094 |
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| Items | – Name: Title Label: Title Group: Ti Data: Thermal-Resistance-Based Reliability of TIM1 Materials in a Lidded Thermal Test Vehicle Under Active Thermal Load-Cycling – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Sternberg%2C+Maik%22">Sternberg, Maik</searchLink><br /><searchLink fieldCode="AR" term="%22May%2C+Daniel%22">May, Daniel</searchLink><br /><searchLink fieldCode="AR" term="%22Wargulski%2C+Dan+R%2E%22">Wargulski, Dan R.</searchLink><br /><searchLink fieldCode="AR" term="%22Pareek%2C+Kaushal+Arun%22">Pareek, Kaushal Arun</searchLink><br /><searchLink fieldCode="AR" term="%22Wunderle%2C+Bernhard%22">Wunderle, Bernhard</searchLink><br /><searchLink fieldCode="AR" term="%22Ras%2C+Mohamad+Abo%22">Ras, Mohamad Abo</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edseee&AN=edseee.11216935 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/THERMINIC65879.2025.11216935 PhysicalDescription: Pagination: PageCount: 6 StartPage: 1 Titles: – TitleFull: Thermal-Resistance-Based Reliability of TIM1 Materials in a Lidded Thermal Test Vehicle Under Active Thermal Load-Cycling Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sternberg, Maik – PersonEntity: Name: NameFull: May, Daniel – PersonEntity: Name: NameFull: Wargulski, Dan R. – PersonEntity: Name: NameFull: Pareek, Kaushal Arun – PersonEntity: Name: NameFull: Wunderle, Bernhard – PersonEntity: Name: NameFull: Ras, Mohamad Abo IsPartOfRelationships: – BibEntity: Dates: – D: 24 M: 09 Type: published Y: 2025 Identifiers: – Type: isbn-print Value: 9798331594862 – Type: issn-print Value: 24741523 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on Type: main |
| ResultId | 1 |