Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions
Συγγραφείς: Ziegeler, Nils J., Schweizer, Stefan
Πηγή: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025
Relation: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Βάση Δεδομένων: IEEE Xplore Digital Library