Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions |
| Συγγραφείς: |
Ziegeler, Nils J., Schweizer, Stefan |
| Πηγή: |
2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025 |
| Relation: |
2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |