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Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions

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Title: Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions
Authors: Ziegeler, Nils J., Schweizer, Stefan
Source: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025
Relation: 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Database: IEEE Xplore Digital Library
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        Value: 10.1109/THERMINIC65879.2025.11216930
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            – D: 24
              M: 09
              Type: published
              Y: 2025
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