Ziegeler, N. J., & Schweizer, S. (2025). Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions. 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on, 1. https://doi.org/10.1109/THERMINIC65879.2025.11216930
Παραπομπή σε μορφή Chicago (17η εκδ.)Ziegeler, Nils J., και Stefan Schweizer. "Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions." 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on 2025: 1. https://doi.org/10.1109/THERMINIC65879.2025.11216930.
Παραπομπή σε μορφή MLA (9th εκδ.)Ziegeler, Nils J., και Stefan Schweizer. "Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions." 2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on, 2025, p. 1, https://doi.org/10.1109/THERMINIC65879.2025.11216930.