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Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation

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Τίτλος: Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation
Συγγραφείς: Cho, Young Jin, Chul Kim, Min, Kim, Hyun Su, Geun Jo, Hyeong, Park, Kwan Kyu
Πηγή: 2025 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2025 IEEE International. :1-4 Sep, 2025
Relation: 2025 IEEE International Ultrasonics Symposium (IUS)
Βάση Δεδομένων: IEEE Xplore Digital Library
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PubType: Conference
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  Data: Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation
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  Data: 2025 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2025 IEEE International. :1-4 Sep, 2025
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  Data: 2025 IEEE International Ultrasonics Symposium (IUS)
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        Value: 10.1109/IUS62464.2025.11201813
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      – TitleFull: Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation
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            NameFull: Cho, Young Jin
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            NameFull: Chul Kim, Min
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            NameFull: Kim, Hyun Su
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            NameFull: Geun Jo, Hyeong
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            NameFull: Park, Kwan Kyu
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              Y: 2025
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