Cho, Y. J., Chul Kim, M., Kim, H. S., Geun Jo, H., & Park, K. K. (2025). Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation. 2025 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2025 IEEE International, 1. https://doi.org/10.1109/IUS62464.2025.11201813
Παραπομπή σε μορφή Chicago (17η εκδ.)Cho, Young Jin, Min Chul Kim, Hyun Su Kim, Hyeong Geun Jo, και Kwan Kyu Park. "Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation." 2025 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2025 IEEE International 2025: 1. https://doi.org/10.1109/IUS62464.2025.11201813.
Παραπομπή σε μορφή MLA (9th εκδ.)Cho, Young Jin, et al. "Experimental Validation of Lateral Pattern Interference Radiation Force Using a Dual-Focus CMUT for Microparticle Manipulation." 2025 IEEE International Ultrasonics Symposium (IUS), Ultrasonics Symposium (IUS), 2025 IEEE International, 2025, p. 1, https://doi.org/10.1109/IUS62464.2025.11201813.