Academic Journal
Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology
| Τίτλος: | Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology |
|---|---|
| Συγγραφείς: | Wang, X., Chen, J., Liang, B., Wen, Y., Shen, F., Chi, Y., Luo, D., Yu, G. |
| Πηγή: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(10):3351-3363 Oct, 2025 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
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