Academic Journal
Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology
| Title: | Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology |
|---|---|
| Authors: | Wang, X., Chen, J., Liang, B., Wen, Y., Shen, F., Chi, Y., Luo, D., Yu, G. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 72(10):3351-3363 Oct, 2025 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189499 15581578 |
|---|---|
| DOI: | 10.1109/TNS.2025.3598057 |