APA (7th ed.) Citation

Wang, X., Chen, J., Liang, B., Wen, Y., Shen, F., Chi, Y., . . . Yu, G. (2025). Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology. IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., 72(10), 3351. https://doi.org/10.1109/TNS.2025.3598057

Chicago Style (17th ed.) Citation

Wang, X., J. Chen, B. Liang, Y. Wen, F. Shen, Y. Chi, D. Luo, and G. Yu. "Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 Nm CMOS Technology." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci. 72, no. 10 (2025): 3351. https://doi.org/10.1109/TNS.2025.3598057.

MLA (9th ed.) Citation

Wang, X., et al. "Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 Nm CMOS Technology." IEEE Transactions on Nuclear Science, Nuclear Science, IEEE Transactions on, IEEE Trans. Nucl. Sci., vol. 72, no. 10, 2025, p. 3351, https://doi.org/10.1109/TNS.2025.3598057.