Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Empirical Finfet Cryo-Model Oriented to Integrated Circuits Design |
| Συγγραφείς: |
Saeed, Ifra, Bosi, Gianni, Esposito, Ciro, D'Aniello, Federico, Charbon, Edoardo, Baschirotto, Andrea, Vadala, Valeria |
| Πηγή: |
2025 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2025 International Conference on. :17-20 Jun, 2025 |
| Relation: |
2025 International Conference on IC Design and Technology (ICICDT) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |