Conference
Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations
| Τίτλος: | Towards a Computationally Efficient Verilog-A Defect-Centric BTI Compact Model for Circuit Aging Simulations |
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| Συγγραφείς: | Sangani, D., Claes, D., Weckx, P., Kaczer, B., Gielen, G. |
| Πηγή: | 2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-6 Mar, 2025 |
| Relation: | 2025 IEEE International Reliability Physics Symposium (IRPS) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331504779 |
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| ISSN: | 19381891 |
| DOI: | 10.1109/IRPS48204.2025.10983507 |