Conference
Label Critic: Design Data Before Models
| Τίτλος: | Label Critic: Design Data Before Models |
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| Συγγραφείς: | Bassi, Pedro R.A. S., Wu, Qilong, Li, Wenxuan, Decherchi, Sergio, Cavalli, Andrea, Yuille, Alan, Zhou, Zongwei |
| Πηγή: | 2025 IEEE 22nd International Symposium on Biomedical Imaging (ISBI) Biomedical Imaging (ISBI), 2025 IEEE 22nd International Symposium on. :1-5 Apr, 2025 |
| Relation: | 2025 IEEE 22nd International Symposium on Biomedical Imaging (ISBI) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9798331520526 |
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| ISSN: | 19458452 |
| DOI: | 10.1109/ISBI60581.2025.10981154 |