Academic Journal
Generating Test Patterns for Chiplet Interconnects With Optimized Effectiveness and Efficiency
| Τίτλος: | Generating Test Patterns for Chiplet Interconnects With Optimized Effectiveness and Efficiency |
|---|---|
| Συγγραφείς: | Chuang, P., Lorenzelli, F., Wu, C., Jan Marinissen, E. |
| Πηγή: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 44(3):1155-1168 Mar, 2025 |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISSN: | 02780070 19374151 |
|---|---|
| DOI: | 10.1109/TCAD.2024.3466809 |