Conference
Towards the Development of a Digital Forensic Readiness Model for 5G NFV Environments
| Τίτλος: | Towards the Development of a Digital Forensic Readiness Model for 5G NFV Environments |
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| Συγγραφείς: | Makura, Sheunesu, Venter, Hein |
| Πηγή: | 2024 IST-Africa Conference (IST-Africa) IST-Africa Conference (IST-Africa), 2024. :1-12 May, 2024 |
| Relation: | 2024 IST-Africa Conference (IST-Africa) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
| ISBN: | 9781905824731 |
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| ISSN: | 25768581 |
| DOI: | 10.23919/IST-Africa63983.2024.10569788 |