Λεπτομέρειες βιβλιογραφικής εγγραφής
| Τίτλος: |
Ultra-thin Double Side SiP Technology with Embedded Trace Substrate |
| Συγγραφείς: |
Li, Jerry Che-Han, Belonio, Jesus Mennen, Tang, Humi Shih-Wen, Wei, Jessie Yu-Shan |
| Πηγή: |
2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :1277-1281 May, 2024 |
| Relation: |
2024 IEEE 74th Electronic Components and Technology Conference (ECTC) |
| Βάση Δεδομένων: |
IEEE Xplore Digital Library |