Conference
Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model
| Τίτλος: | Fast IR-Drop Prediction of Analog Circuits Using Recurrent Synchronized GCN and Y-Net Model |
|---|---|
| Συγγραφείς: | Lee, Seunggyu, Hyun, Daijoon, Jung, Younggwang, Cho, Gangmin, Shin, Youngsoo |
| Πηγή: | 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024 |
| Relation: | 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
| Βάση Δεδομένων: | IEEE Xplore Digital Library |
καταχωρήστε σχόλιο πρώτοι!